Characterization of thin self-assembled films of gold nanocluster films by x-ray reflectometry and grazing-incidence diffraction
- Afiliacje: SL1, SL1.1, SL1.3
- Data opublikowania (wydrukowania): 30-12-00
- Strony: 461-462
- Autor: Pełka Jerzy, Paszkowicz Wojciech, Brust M., Kiely C. J., Knapp M.
- Tytuł publikacji: Characterization of thin self-assembled films of gold nanocluster films by x-ray reflectometry and grazing-incidence diffraction
- DOI: https://doi.org/https://www.google.com/url?sa=t&rct=j&q=&esrc=s&source=web&cd=1&cad=rja&uact=8&ved=2ahUKEwjvvOaG-JPlAhWCxcQBHaNPCmQQFjAAegQIABAB&url=http%3A%2F%2Fhasyweb.desy.de%2Fscience%2Fannual_reports%2F2000_report%2Fpart1%2Fcontrib%2F44%2F3008.pdf&usg=AOvVaw38_SAlv3jC8mk913JDiUl_
- Rok: 2000
- Czasopismo / konferencja / monografia: Hasylab Annual Report (Changed to Photon Science Rep. in 2014)
Hasylab Annual Report (Changed to Photon Science Rep. in 2014), (2000)
